Eléments de l'association
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List of bibliographic references
Number of relevant bibliographic references: 2.| Ident. | Authors (with country if any) | Title |
|---|---|---|
| 000501 | Dale E. Newbury [États-Unis] ; Nicholas W. M. Ritchie [États-Unis] | Can X‐ray spectrum imaging replace backscattered electrons for compositional contrast in the scanning electron microscope? |
| 001224 | Dale E. Newbury [États-Unis] | X‐ray spectrometry and spectrum image mapping at output count rates above 100 kHz with a silicon drift detector on a scanning electron microscope |
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